Department of Chemistry and Molecular Biology, University of Gothenburg, Gothenburg 41296, Sweden.
Anal Chem. 2013 Aug 6;85(15):7447-53. doi: 10.1021/ac401399s. Epub 2013 Jul 8.
We have compared the properties and resistance to DA fouling of a carbon nanotube fiber (CNTF) microelectrode to a traditional carbon fiber (CF) microelectrode. These two materials show comparable electrochemical activities for outer-sphere and inner-sphere redox reactions. Although the CNTF might have a higher intrinsic RC constant, thus limiting its high-frequency behavior, the CNTF shows a significantly higher durability than the CF in terms of electrode stability. During constant oxidation of 100 μM DA, the signal measured by the CNTF microelectrode shows a 2-h window over which no decrease in current is observed. Under the same conditions, the current obtained at the CF microelectrode decreases by almost 50%. A model of the fouling process, assuming the formation of growing patches of insulator on the surface, has been compared to the data. This model is found to be in good agreement with our results and indicates a growth rate of the patches in the 0.1-2 nm s(-1) range.
我们比较了碳纳米管纤维(CNTF)微电极和传统碳纤维(CF)微电极的性质和对 DA 污垢的抵抗力。这两种材料在外层和内层氧化还原反应中表现出相当的电化学活性。尽管 CNTF 的固有 RC 常数可能更高,从而限制了其高频行为,但在电极稳定性方面,CNTF 的耐久性明显高于 CF。在 100 μM DA 的恒定氧化过程中,通过 CNTF 微电极测量的信号在 2 小时的窗口内没有观察到电流下降。在相同条件下,CF 微电极获得的电流下降了近 50%。对污垢形成过程的模型进行了假设,即在表面形成不断生长的绝缘体斑块,该模型与数据进行了比较。结果表明,该模型与我们的结果非常吻合,并表明斑块的生长速度在 0.1-2nm/s 范围内。