Wicker Kai
Opt Express. 2013 Oct 21;21(21):24692-701. doi: 10.1364/OE.21.024692.
The artefact-free reconstruction of structured illumination microscopy images requires precise knowledge of the pattern phases in the raw images. If this parameter cannot be controlled precisely enough in an experimental setup, the phases have to be determined a posteriori from the acquired data. While an iterative optimisation based on cross-correlations between individual Fourier images yields accurate results, it is rather time-consuming. Here I present a fast non-iterative technique which determines each pattern phase from an auto-correlation of the respective Fourier image. In addition to improving the speed of the reconstruction, simulations show that this method is also more robust, yielding errors of typically less than λ/500 under realistic signal-to-noise levels.
结构光照明显微镜图像的无伪影重建需要精确了解原始图像中的图案相位。如果在实验装置中无法足够精确地控制此参数，则必须从采集的数据中事后确定相位。虽然基于各个傅里叶图像之间的互相关的迭代优化可产生准确的结果，但这相当耗时。在此，我提出一种快速非迭代技术，该技术从各个傅里叶图像的自相关中确定每个图案相位。除了提高重建速度外，模拟表明该方法也更稳健，在实际信噪比水平下产生的误差通常小于λ/500。
