Opt Lett. 2013 Nov 15;38(22):4723-6. doi: 10.1364/OL.38.004723.
Structured illumination microscopy (SIM) is a powerful technique for obtaining super-resolved fluorescence maps of samples, but it is very sensitive to aberrations or misalignments affecting the excitation patterns. Here, we present a reconstruction algorithm that is able to process SIM data even if the illuminations are strongly distorted. The approach is an extension of the recent blind-SIM technique, which reconstructs simultaneously the sample and the excitation patterns without a priori information on the latter. Our algorithm was checked on synthetic and experimental data using distorted and nondistorted illuminations. The reconstructions were similar to that obtained by up-to-date SIM methods when the illuminations were periodic and remained artifact-free when the illuminations were strongly distorted.
结构光照明显微镜（SIM）是一种获取样品超分辨率荧光图谱的强大技术，但它对影响激发模式的像差或失准非常敏感。在这里，我们提出了一种重建算法，即使激发光严重变形，它也能够处理 SIM 数据。该方法是最近的盲 SIM 技术的扩展，该技术在没有激发光先验信息的情况下同时重建样品和激发模式。我们的算法使用变形和非变形照明对合成和实验数据进行了检查。当照明是周期性的时候，重建结果与最新的 SIM 方法相似，而当照明严重变形时，重建结果仍然没有伪影。
