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一种用于测量单个一维NiO纳米棒平均电学性质的有效方法。

An efficient methodology for measurement of the average electrical properties of single one-dimensional NiO nanorods.

作者信息

Patil Ranjit A, Devan Rupesh S, Lin Jin-Han, Liou Yung, Ma Yuan-Ron

机构信息

Department of Physics, National Dong Hwa University, Hualien 97401, Taiwan.

出版信息

Sci Rep. 2013 Oct 29;3:3070. doi: 10.1038/srep03070.

DOI:10.1038/srep03070
PMID:24166185
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC3810655/
Abstract

We utilized a metal tantalum (Ta) ball-probe to measure the electrical properties of vertical-aligned one-dimensional (1D) nickel-oxide (NiO) nanorods. The 1D NiO nanorods (on average, ~105 nm wide and ~700 nm long) are synthesized using the hot-filament metal-oxide vapor deposition (HFMOVD) technique, and they are cubic phased and have a wide bandgap of 3.68 eV. When the 1D NiO nanorods are arranged in a large-area array in ohmic-contact with the Ta ball-probe, they acted as many parallel resistors. By means of a rigorous calculation, we can easily acquire the average resistance RNR and resistivity ρNR of a single NiO nanorod, which were approximately 3.1 × 10(13) Ω and 4.9 × 10(7) Ω.cm, respectively.

摘要

我们使用金属钽(Ta)球形探针来测量垂直排列的一维(1D)氧化镍(NiO)纳米棒的电学性质。一维NiO纳米棒(平均宽度约为105 nm,长度约为700 nm)采用热丝金属氧化物气相沉积(HFMOVD)技术合成,它们为立方相,具有3.68 eV的宽带隙。当一维NiO纳米棒以大面积阵列形式与Ta球形探针形成欧姆接触时,它们起到了许多并联电阻的作用。通过严格计算,我们可以轻松获得单个NiO纳米棒的平均电阻RNR和电阻率ρNR,分别约为3.1×10(13) Ω和4.9×10(7) Ω·cm。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/bc910c470b5c/srep03070-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/f9fa59bae116/srep03070-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/d5144d6da1be/srep03070-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/bc910c470b5c/srep03070-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/f9fa59bae116/srep03070-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/d5144d6da1be/srep03070-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ce59/3810655/bc910c470b5c/srep03070-f3.jpg

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