Centre de Recherche de Gif, Institut de Chimie des Substances Naturelles, CNRS, Avenue de la Terrasse, 91198, Gif-sur-Yvette Cedex, France.
Mass Spectrom Rev. 2014 Nov-Dec;33(6):442-51. doi: 10.1002/mas.21399. Epub 2013 Nov 21.
Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform three-dimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization.
本文介绍了用于团簇飞行时间二次离子质谱（TOF-SIMS）成像的仪器、离子束或分析器的最新发展。还说明了用于提高灵敏度或在有机材料中进行三维分析的方法。该综述展示了通过簇 TOF-SIMS 在各种类型的材料和应用中进行脂质成像的改进，并说明了其应用扩展的原因。
