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采用化学气相沉积(CVD)法在石英衬底上无金属生长石墨烯。

Metal free growth of graphene on quartz substrate using chemical vapor deposition (CVD).

作者信息

Hwang Jeonghyun, Kim Moonkyung, Cha Ho-Young, Spencer Michael G, Lee Jo-Won

出版信息

J Nanosci Nanotechnol. 2014 Apr;14(4):2979-83. doi: 10.1166/jnn.2014.8583.

Abstract

Graphene was grown on (0001) quartz substrate (z-cut) using catalyst free Chemical Vapor Deposition (CVD). Methane was used as a carbon source and hydrogen was introduced independently to optimize the growth. The effect of growth temperature was investigated while varying the temperature between 1000 and 1300 degrees C. With an optimized condition, a thin (< or = 2 mono-layer) continuous graphene film was grown as confirmed by Raman spectroscopy, optical transmission, and electrical measurements. The best quality film showed the Raman D-peak to G-peak intensity ratio of approximately 0.8 with the 2D-peak width of approximately 60 cm(-1). High resolution X-ray Photoelectron Spectroscopy (XPS) revealed that the grown graphene is slightly oxidized but there is no detectable Si--C chemical bond in the graphene/quartz system. Hall effect measurements exhibited a carrier mobility of approximately 400 cm2/V x s with a sheet carrier density of approximately 5 x 10(12) cm(-2).

摘要

使用无催化剂化学气相沉积(CVD)在(0001)石英衬底(z切割)上生长石墨烯。甲烷用作碳源,独立引入氢气以优化生长。在1000至1300摄氏度之间改变温度时,研究了生长温度的影响。在优化条件下,通过拉曼光谱、光透射和电学测量证实生长出了薄的(≤2单层)连续石墨烯薄膜。质量最好的薄膜显示拉曼D峰与G峰强度比约为0.8,2D峰宽度约为60 cm⁻¹。高分辨率X射线光电子能谱(XPS)表明,生长的石墨烯略有氧化,但在石墨烯/石英体系中未检测到Si-C化学键。霍尔效应测量显示载流子迁移率约为400 cm²/V·s,面载流子密度约为5×10¹² cm⁻²。

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