Saffar S, Gouttebroze S, Zhang Z L
Department of Structural Engineering, Norwegian University of Science and Technology , NO-7491 Trondheim , Norway.
SINTEF Materials and Chemistry , NO-0315 Oslo , Norway.
J Sol Energy Eng. 2014 Feb;136(1):0110011-110018. doi: 10.1115/1.4024248. Epub 2013 Jul 2.
Vibration is one of the most common loading modes during handling and transport of solar silicon wafers and has a great influence on the breakage rate. In order to control the breakage rate during handling and facilitate the optimization of the processing steps, it is important to understand the factors which influence the natural frequency of thin silicon wafers. In this study, we applied nonlinear finite element method to investigate the correlation of natural frequency of thin solar silicon wafer with material microstructures (grain size and grain orientation), thickness variation and crack geometry (position and size). It has been found that the natural frequency for anisotropic single crystal silicon wafer is a strong function of material orientation. Less than 10% thickness variation will have a negligible effect on natural frequency. It is also found out that cracks smaller than 20 mm have no dominant effect on the first five natural frequency modes anywhere in the silicon wafer.
振动是太阳能硅片搬运和运输过程中最常见的加载模式之一，对破损率有很大影响。为了控制搬运过程中的破损率并便于优化加工步骤，了解影响薄硅片固有频率的因素很重要。在本研究中，我们应用非线性有限元方法来研究薄太阳能硅片固有频率与材料微观结构（晶粒尺寸和晶粒取向）、厚度变化以及裂纹几何形状（位置和尺寸）之间的相关性。研究发现，各向异性单晶硅片的固有频率强烈依赖于材料取向。厚度变化小于10%对固有频率的影响可忽略不计。还发现，小于20毫米的裂纹对硅片任何位置的前五个固有频率模式都没有显著影响。
