浦项加速器实验室二期的硬X射线纳米断层扫描光束线7C XNI

Hard X-ray nanotomography beamline 7C XNI at PLS-II.

作者信息

Lim Jun, Kim Hyounggyu, Park So Yeong

机构信息

Beamline Division, Pohang Light Source, Hyoja, Pohang, Kyung-buk 790784, Republic of Korea.

School of Information and Mechatronics, GIST, 123 Cheomdan, Buk-gu, Gwangju 500712, Republic of Korea.

出版信息

J Synchrotron Radiat. 2014 Jul;21(Pt 4):827-31. doi: 10.1107/S1600577514008224. Epub 2014 May 14.

DOI:10.1107/S1600577514008224

PMID:24971982

Abstract

The synchrotron-based hard X-ray nanotomography beamline, named 7C X-ray Nano Imaging (XNI), was recently established at Pohang Light Source II. This beamline was constructed primarily for full-field imaging of the inner structures of biological and material samples. The beamline normally provides 46 nm resolution for still images and 100 nm resolution for tomographic images, with a 40 µm field of view. Additionally, for large-scale application, it is capable of a 110 µm field of view with an intermediate resolution.

摘要

基于同步加速器的硬X射线纳米断层成像光束线，名为7C X射线纳米成像（XNI），最近在浦项光源二期建成。该光束线主要用于生物和材料样品内部结构的全场成像。该光束线通常为静态图像提供46纳米的分辨率，为断层图像提供100纳米的分辨率，视场为40微米。此外，对于大规模应用，它能够以中等分辨率实现110微米的视场。