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提高吸收和泽尼克相衬纳米断层扫描的时间分辨率:实现快速原位实验。

Pushing the temporal resolution in absorption and Zernike phase contrast nanotomography: enabling fast in situ experiments.

作者信息

Flenner Silja, Storm Malte, Kubec Adam, Longo Elena, Döring Florian, Pelt Daniël M, David Christian, Müller Martin, Greving Imke

机构信息

Institute of Materials Research, Helmholtz-Zentrum Geesthacht, Max-Planck-Strasse 1, 21502 Geesthacht, Germany.

Diamond Light Source Ltd, Didcot, Oxfordshire OX11 0DE, United Kingdom.

出版信息

J Synchrotron Radiat. 2020 Sep 1;27(Pt 5):1339-1346. doi: 10.1107/S1600577520007407. Epub 2020 Jul 30.

Abstract

Hard X-ray nanotomography enables 3D investigations of a wide range of samples with high resolution (<100 nm) with both synchrotron-based and laboratory-based setups. However, the advantage of synchrotron-based setups is the high flux, enabling time resolution, which cannot be achieved at laboratory sources. Here, the nanotomography setup at the imaging beamline P05 at PETRA III is presented, which offers high time resolution not only in absorption but for the first time also in Zernike phase contrast. Two test samples are used to evaluate the image quality in both contrast modalities based on the quantitative analysis of contrast-to-noise ratio (CNR) and spatial resolution. High-quality scans can be recorded in 15 min and fast scans down to 3 min are also possible without significant loss of image quality. At scan times well below 3 min, the CNR values decrease significantly and classical image-filtering techniques reach their limitation. A machine-learning approach shows promising results, enabling acquisition of a full tomography in only 6 s. Overall, the transmission X-ray microscopy instrument offers high temporal resolution in absorption and Zernike phase contrast, enabling in situ experiments at the beamline.

摘要

硬X射线纳米断层扫描能够通过基于同步加速器和基于实验室的装置,以高分辨率(<100 nm)对各种样品进行三维研究。然而,基于同步加速器的装置的优势在于高通量,能够实现时间分辨,这是实验室光源无法做到的。在此,介绍了PETRA III成像光束线P05处的纳米断层扫描装置,它不仅在吸收成像中,而且首次在泽尼克相衬成像中提供了高时间分辨率。基于对比度噪声比(CNR)和空间分辨率的定量分析,使用两个测试样品来评估两种对比度模式下的图像质量。高质量扫描可在15分钟内完成,快速扫描至3分钟也可行,且图像质量无显著损失。在扫描时间远低于3分钟时,CNR值显著下降,传统图像滤波技术达到其极限。一种机器学习方法显示出有前景的结果,能够仅在6秒内完成全断层扫描。总体而言,该透射X射线显微镜仪器在吸收成像和泽尼克相衬成像中提供了高时间分辨率,能够在光束线进行原位实验。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/88d3/7467338/96e38d3e1ea8/s-27-01339-fig1.jpg

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