Dale John, Hughes Ben, Lancaster Andrew J, Lewis Andrew J, Reichold Armin J H, Warden Matthew S
Opt Express. 2014 Oct 6;22(20):24869-93. doi: 10.1364/OE.22.024869.
We present an implementation of an absolute distance measurement system which uses frequency scanning interferometry (FSI). The technique, referred to as dynamic FSI, uses two frequency scanning lasers, a gas absorption cell and a reference interferometer to determine the unknown optical path length difference (OPD) of one or many measurement interferometers. The gas absorption cell is the length reference for the measurement system and is traceable to international standards through knowledge of the frequencies of its absorption features. The OPD of the measurement interferometers can vary during the measurement and the variation is measured at the sampling rate of the system (2.77 MHz in the system described here). The system is shown to measure distances from 0.2 m to 20 m with a combined relative uncertainty of 0.41 × 10⁻⁶ at the two sigma level (k = 2). It will be shown that within a scan the change in OPD of the measurement interferometer can be determined to a resolution of 40 nm.
我们展示了一种采用频率扫描干涉测量法(FSI)的绝对距离测量系统的实现方案。该技术被称为动态FSI,它使用两台频率扫描激光器、一个气体吸收池和一个参考干涉仪来确定一个或多个测量干涉仪的未知光程差(OPD)。气体吸收池是测量系统的长度参考,通过了解其吸收特征的频率可追溯到国际标准。测量干涉仪的OPD在测量过程中可能会发生变化,并且该变化以系统的采样率(在此处描述的系统中为2.77 MHz)进行测量。该系统在2σ水平(k = 2)下测量距离范围为0.2 m至20 m时,合成相对不确定度为0.41×10⁻⁶。结果将表明,在一次扫描内,测量干涉仪的OPD变化能够被确定到40 nm的分辨率。