Sato K, Miyazaki H, Gondo T, Miyazaki S, Murayama M, Hata S
Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Mel-Build Corporation, Nishi-ku, Fukuoka 819-0052, Japan.
Microscopy (Oxf). 2015 Oct;64(5):369-75. doi: 10.1093/jmicro/dfv021. Epub 2015 Apr 22.
We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10(-6) and 5.2 × 10(-3) s(-1). We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as 'straining and tomography holder', will have wide range potential applications in materials science.
我们开发了一种新设计的用于原位透射电子显微镜（TEM）的拉伸试样 holder，它与高角度单倾斜轴电子断层扫描兼容。该 holder 可以在拉伸应力下使 TEM 试样变形，应变速率在 1.5×10⁻⁶至 5.2×10⁻³ s⁻¹之间。我们还证实，使用矩形铝试样时，试样 holder 的最大倾斜角度达到±60°。这种新的试样 holder，被称为“拉伸和断层扫描 holder”，将在材料科学中具有广泛的潜在应用。
