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单层二硫化钼在面外直接压缩下:低应力能隙工程。

Single Layer Molybdenum Disulfide under Direct Out-of-Plane Compression: Low-Stress Band-Gap Engineering.

机构信息

†J. Heyrovsky Institute of Physical Chemistry of the AS CR, v.v.i., Dolejskova 2155/3, 182 23 Prague 8, Czech Republic.

‡Departamento de Química Física I, Facultad de Ciencias Químicas, Universidad Complutense de Madrid, Madrid 28040, Spain.

出版信息

Nano Lett. 2015 May 13;15(5):3139-46. doi: 10.1021/acs.nanolett.5b00229. Epub 2015 Apr 30.

Abstract

Tuning the electronic structure of 2D materials is a very powerful asset toward tailoring their properties to suit the demands of future applications in optoelectronics. Strain engineering is one of the most promising methods in this regard. We demonstrate that even very small out-of-plane axial compression readily modifies the electronic structure of monolayer MoS2. As we show through in situ resonant and nonresonant Raman spectroscopy and photoluminescence measurements combined with theoretical calculations, the transition from direct to indirect band gap semiconductor takes place at ∼0.5 GPa, and the transition to a semimetal occurs at stress smaller than 3 GPa.

摘要

调控二维材料的电子结构是一项非常强大的技术,可用于调整其性能以满足未来光电子应用的需求。应变工程是这方面最有前途的方法之一。我们证明,即使是非常小的面外轴向压缩也很容易改变单层 MoS2 的电子结构。正如我们通过原位共振和非共振拉曼光谱以及光致发光测量结合理论计算所表明的那样,直接带隙半导体到间接带隙半导体的转变发生在约 0.5 GPa,而向半导体的转变发生在小于 3 GPa 的压力下。

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