Materials Science and Engineering Department, University of Washington, Seattle, WA 98195-2120, USA.
State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China.
Sci Rep. 2015 May 13;5:10136. doi: 10.1038/srep10136.
Intriguing experimental results raised the question about the fundamental mechanisms governing the electron-hole coupling induced bipolar thermal conduction in semiconductors. Our combined theoretical analysis and experimental measurements show that in semiconductors bipolar thermal transport is in general a "conductivity-limiting" phenomenon, and it is thus controlled by the carrier mobility ratio and by the minority carrier partial electrical conductivity for the intrinsic and extrinsic cases, respectively. Our numerical method quantifies the role of electronic band structure and carrier scattering mechanisms. We have successfully demonstrated bipolar thermal conductivity reduction in doped semiconductors via electronic band structure modulation and/or preferential minority carrier scatterings. We expect this study to be beneficial to the current interests in optimizing thermoelectric properties of narrow gap semiconductors.
有趣的实验结果提出了一个问题,即是什么基本机制控制了半导体中电子-空穴耦合诱导的双极热导。我们的理论分析和实验测量表明,在半导体中,双极热输运通常是一种“电导率限制”现象,因此分别由载流子迁移率比和本征和外部分子载流子部分电导率控制。我们的数值方法量化了电子能带结构和载流子散射机制的作用。我们已经成功地通过电子能带结构调制和/或优先的少数载流子散射在掺杂半导体中证明了双极热导率的降低。我们期望这项研究有助于当前优化窄带隙半导体热电性能的兴趣。