Xu Yuehua, Dai Jun, Zeng Xiao Cheng
†School of Mathematics and Physics, Changzhou University, Changzhou 213164, People's Republic of China.
‡Department of Chemistry and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, 536 Hamilton Hall, Lincoln, Nebraska 68588, United States.
J Phys Chem Lett. 2015 Jun 4;6(11):1996-2002. doi: 10.1021/acs.jpclett.5b00510. Epub 2015 May 14.
We perform the first-principles computational study of the effect of number of stacking layers and stacking style of the few-layer black phosphorus (BPs) on the electronic properties, including transport gap, current-voltage (i-v) relation, and differential conductance. Our computation is based on the nonequilibrium Green's function approach combined with density functional theory calculations. Specifically, we compute electron-transport properties of monolayer BP, bilayer BP, and trilayer BP as well as bilayer BPs with AB-, AA-, or AC-stacking. We find that the stacking number has greater influence on the transport gap than the stacking type. Conversely, the stacking type has greater influence on i-v curve and differential conductance than on the transport gap. This study offers useful guidance for determining the number of stacking layers and the stacking style of few-layer BP sheets in future experimental measurements and for potential applications in nanoelectronic devices.
我们对少层黑磷(BP)的堆叠层数和堆叠方式对电子性质的影响进行了第一性原理计算研究,这些电子性质包括输运能隙、电流-电压(i-v)关系和微分电导。我们的计算基于非平衡格林函数方法并结合密度泛函理论计算。具体而言,我们计算了单层BP、双层BP和三层BP以及具有AB-、AA-或AC-堆叠的双层BP的电子输运性质。我们发现,堆叠层数对输运能隙的影响比堆叠类型更大。相反,堆叠类型对i-v曲线和微分电导的影响比对输运能隙的影响更大。这项研究为未来实验测量中确定少层BP片的堆叠层数和堆叠方式以及在纳米电子器件中的潜在应用提供了有用的指导。