Swinkels M Y, van Delft M R, Oliveira D S, Cavalli A, Zardo I, van der Heijden R W, Bakkers E P A M
Eindhoven University of Technology, 5600 MB, Eindhoven, The Netherlands.
Nanotechnology. 2015 Sep 25;26(38):385401. doi: 10.1088/0957-4484/26/38/385401. Epub 2015 Sep 2.
The diameter dependence of the thermal conductivity of InAs nanowires in the range of 40-1500 nm has been measured. We demonstrate a reduction in thermal conductivity of 80% for 40 nm nanowires, opening the way for further design strategies for nanoscaled thermoelectric materials. Furthermore, we investigate the effect of thermal contact in the most common measurement method for nanoscale thermal conductivity. Our study allows for the determination of the thermal contact using existing measurement setups. The thermal contact resistance is found to be comparable to the wire thermal resistance for wires with a diameter of 90 nm and higher.
已测量了直径在40 - 1500纳米范围内的砷化铟纳米线热导率与直径的关系。我们证明,对于40纳米的纳米线,其热导率降低了80%,这为纳米级热电材料的进一步设计策略开辟了道路。此外,我们研究了纳米级热导率最常用测量方法中的热接触效应。我们的研究使得利用现有测量装置确定热接触成为可能。对于直径为90纳米及以上的导线,发现其热接触电阻与导线热阻相当。