Freitas R R Q, Mota F de Brito, Rivelino R, de Castilho C M C, Kakanakova-Georgieva A, Gueorguiev G K
Grupo de Física de Superfícies e Materiais, Instituto de Física, Universidade Federal da Bahia, Campus Universitário da Federação, 40170-115 Salvador, Bahia, Brazil. Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden.
J Phys Condens Matter. 2015 Dec 9;27(48):485306. doi: 10.1088/0953-8984/27/48/485306. Epub 2015 Nov 16.
The band structure and stability of XBi and XBi3 (X = B, Al, Ga, and In) single sheets are predicted using first-principles calculations. It is demonstrated that the band gap values of these new classes of two-dimensional (2D) materials depend on both the spin-orbit coupling (SOC) and type of group-III elements in these hetero-sheets. Thus, topological properties can be achieved, allowing for viable applications based on coherent spin transport at room temperature. The spin-orbit effects are proved to be essential to explain the tunability by group-III atoms. A clear effect of including SOC in the calculations is lifting the spin degeneracy of the bands at the Γ point of the Brillouin zone. The nature of the band gaps, direct or indirect, is also tuned by SOC, and by the appropriate X element involved. It is observed that, in the case of XBi single sheets, band inversions naturally occur for GaBi and InBi, which exhibit band gap values around 172 meV. This indicates that these 2D materials are potential candidates for topological insulators. On the contrary, a similar type of band inversion, as obtained for the XBi, was not observed in the XBi3 band structure. In general, the calculations, taking into account SOC, reveal that some of these buckled sheets exhibit sizable gaps, making them suitable for applications in room-temperature spintronic devices.
利用第一性原理计算预测了XBi和XBi3(X = B、Al、Ga和In)单层的能带结构和稳定性。结果表明,这些新型二维(2D)材料的带隙值取决于自旋轨道耦合(SOC)以及这些异质单层中III族元素的类型。因此,可以实现拓扑性质,从而为基于室温下相干自旋输运的可行应用提供可能。自旋轨道效应被证明对于解释III族原子的可调性至关重要。计算中包含SOC的一个明显效果是消除了布里渊区Γ点处能带的自旋简并。带隙的性质,无论是直接的还是间接的,也会受到SOC以及所涉及的合适X元素的调节。观察到,在XBi单层的情况下,GaBi和InBi自然会发生能带反转,其带隙值约为172 meV。这表明这些二维材料是拓扑绝缘体的潜在候选者。相反,在XBi3的能带结构中未观察到与XBi类似的能带反转类型。总体而言,考虑到SOC的计算表明,其中一些弯曲的单层具有可观的带隙,使其适用于室温自旋电子器件。