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通过化学气相沉积法在Ge(100)/Si(100)衬底上生长石墨烯。

Graphene growth on Ge(100)/Si(100) substrates by CVD method.

作者信息

Pasternak Iwona, Wesolowski Marek, Jozwik Iwona, Lukosius Mindaugas, Lupina Grzegorz, Dabrowski Pawel, Baranowski Jacek M, Strupinski Wlodek

机构信息

Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland.

IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany.

出版信息

Sci Rep. 2016 Feb 22;6:21773. doi: 10.1038/srep21773.

Abstract

The successful integration of graphene into microelectronic devices is strongly dependent on the availability of direct deposition processes, which can provide uniform, large area and high quality graphene on nonmetallic substrates. As of today the dominant technology is based on Si and obtaining graphene with Si is treated as the most advantageous solution. However, the formation of carbide during the growth process makes manufacturing graphene on Si wafers extremely challenging. To overcome these difficulties and reach the set goals, we proposed growth of high quality graphene layers by the CVD method on Ge(100)/Si(100) wafers. In addition, a stochastic model was applied in order to describe the graphene growth process on the Ge(100)/Si(100) substrate and to determine the direction of further processes. As a result, high quality graphene was grown, which was proved by Raman spectroscopy results, showing uniform monolayer films with FWHM of the 2D band of 32 cm(-1).

摘要

将石墨烯成功集成到微电子器件中在很大程度上依赖于直接沉积工艺的可用性,这种工艺能够在非金属衬底上提供均匀、大面积且高质量的石墨烯。截至目前,主导技术基于硅,并且将用硅制备石墨烯视为最具优势的解决方案。然而,在生长过程中碳化物的形成使得在硅片上制造石墨烯极具挑战性。为了克服这些困难并实现既定目标,我们提出通过化学气相沉积(CVD)方法在Ge(100)/Si(100)晶片上生长高质量的石墨烯层。此外,应用了一个随机模型来描述在Ge(100)/Si(100)衬底上的石墨烯生长过程,并确定后续工艺的方向。结果,生长出了高质量的石墨烯,拉曼光谱结果证明了这一点,显示出具有32 cm(-1)的2D带半高宽的均匀单层膜。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a3c4/4761869/10353599729a/srep21773-f1.jpg

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