Liu Penghao, Shi Yaocheng
Appl Opt. 2016 May 1;55(13):3537-41. doi: 10.1364/AO.55.003537.
We present the design, fabrication, and characterization of a dual polarization silicon-on-insulator (SOI) microring resonator (MRR) for simultaneous measurement of refractive index (RI) and temperature. Due to the different energy distribution of transverse electric (TE) and transverse magnetic (TM) modes for the SOI waveguide, the TE and TM polarizations can have quite different sensitivities toward the changes of ambient RI and temperature. By using a gapless asymmetric coupling section, TE0 mode and TM0 mode have been excited simultaneously in the MRR. We demonstrated the feasibility ofobtaining RI and temperature simultaneously with a single measurement, achieving a RI sensitivity of 104 nm/RIU (refractive index unit) and a temperature sensitivity of 78.7 pm/°C for TE0 mode and a RI sensitivity of 319 nm/RIU and a temperature sensitivity of 34.1 pm/°C for TM0 mode.
我们展示了一种用于同时测量折射率（RI）和温度的双偏振绝缘体上硅（SOI）微环谐振器（MRR）的设计、制造和特性。由于SOI波导的横向电场（TE）和横向磁场（TM）模式的能量分布不同，TE和TM偏振对环境RI和温度变化的灵敏度可能有很大差异。通过使用无间隙非对称耦合段，在MRR中同时激发了TE0模式和TM0模式。我们证明了单次测量同时获取RI和温度的可行性，对于TE0模式，实现了104 nm/RIU（折射率单位）的RI灵敏度和78.7 pm/°C的温度灵敏度，对于TM0模式，实现了319 nm/RIU的RI灵敏度和34.1 pm/°C的温度灵敏度。
