基于条形波导的高度紧凑折射率传感器，用于芯片实验室传感应用。

Highly compact refractive index sensor based on stripe waveguides for lab-on-a-chip sensing applications.

作者信息

Perera Chamanei, Vernon Kristy, Cheng Elliot, Sathian Juna, Jaatinen Esa, Davis Timothy

机构信息

Science and Engineering Faculty, Queensland University of Technology, Brisbane 4001, Queensland, Australia.

Australian National Nanofabrication Facility QLD node, University of Queensland, St Lucia 4072, Queensland, Australia.

出版信息

Beilstein J Nanotechnol. 2016 May 25;7:751-7. doi: 10.3762/bjnano.7.66. eCollection 2016.

DOI:10.3762/bjnano.7.66

PMID:27335763

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4901982/

Abstract

In this paper we report the design and experimental realisation of a novel refractive index sensor based on coupling between three nanoscale stripe waveguides. The sensor is highly compact and designed to operate at a single wavelength. We demonstrate that the sensor exhibits linear response with a resolution of 6 × 10(-4) RIU (refractive index unit) for a change in relative output intensity of 1%. Authors expect that the outcome of this paper will prove beneficial in highly compact, label-free and highly sensitive refractive index analysis.

摘要

在本文中，我们报告了一种基于三个纳米级条纹波导之间耦合的新型折射率传感器的设计与实验实现。该传感器高度紧凑，设计用于在单一波长下工作。我们证明，对于1%的相对输出强度变化，该传感器呈现出线性响应，分辨率为6×10⁻⁴RIU（折射率单位）。作者期望本文的成果将在高度紧凑、无标记且高灵敏度的折射率分析中证明是有益的。