Noun Manale, Van Elslande Elsa, Touboul David, Glanville Helen, Bucklow Spike, Walter Philippe, Brunelle Alain
Laboratoire d'Archéologie Moléculaire et Structurale (LAMS), Sorbonne Universités, UPMC Univ Paris 06, CNRS, UMR 8220, 5 Place Jussieu, 75005, Paris, France.
Institut de Chimie des Substances Naturelles, CNRS UPR 2301, Univ. Paris-Sud, Université Paris-Saclay, Avenue de la Terrasse, 91198, Gif-sur-Yvette, France.
J Mass Spectrom. 2016 Dec;51(12):1196-1210. doi: 10.1002/jms.3885.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging using cluster primary ion beams is used for the identification of the pigments in the painting of Rebecca and Eliezer at the Well by Nicolas Poussin. The combination of the high mass resolution of the technique with a sub-micrometer spatial resolution offered by a delayed extraction of the secondary ions, together with the possibility to simultaneously identifying both minerals and organics, has proved to be the method of choice for the study of the stratigraphy of a paint cross section. The chemical compositions of small grains are shown with the help of a thorough processing of the data, with images of specific ions, mass spectra extracted from small regions of interest, and profiles drawn along the different painting layers. Copyright © 2016 John Wiley & Sons, Ltd.
采用簇初级离子束的飞行时间二次离子质谱（TOF-SIMS）成像技术用于鉴定尼古拉斯·普桑所作的《丽贝卡与以利以谢在井边》这幅画中的颜料。该技术的高质量分辨率与二次离子延迟提取所提供的亚微米空间分辨率相结合，再加上能够同时识别矿物和有机物的可能性，已被证明是研究油漆横截面地层学的首选方法。借助对数据的全面处理，展示了小颗粒的化学成分，包括特定离子的图像、从小感兴趣区域提取的质谱以及沿不同绘画层绘制的剖面图。版权所有© 2016约翰·威利父子有限公司。
