Department of Systems Design Engineering, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada.
Sci Rep. 2016 Dec 13;6:38981. doi: 10.1038/srep38981.
Wide-field lensfree on-chip microscopy, which leverages holography principles to capture interferometric light-field encodings without lenses, is an emerging imaging modality with widespread interest given the large field-of-view compared to lens-based techniques. In this study, we introduce the idea of laser light-field fusion for lensfree on-chip phase contrast microscopy for detecting nanoparticles, where interferometric laser light-field encodings acquired using a lensfree, on-chip setup with laser pulsations at different wavelengths are fused to produce marker-free phase contrast images of particles at the nanometer scale. As a proof of concept, we demonstrate, for the first time, a wide-field lensfree on-chip instrument successfully detecting 300 nm particles across a large field-of-view of ~30 mm without any specialized or intricate sample preparation, or the use of synthetic aperture- or shift-based techniques.
宽场无透镜片上显微镜利用全息术原理在无需透镜的情况下捕获干涉光场编码，与基于透镜的技术相比，其具有更大的视场，因此引起了广泛关注。在这项研究中，我们提出了用于无透镜片上相衬显微镜的激光光场融合的想法，用于检测纳米粒子，其中使用无透镜、片上设置以不同波长的激光脉冲获取的干涉激光光场编码被融合，以产生纳米级粒子的无标记相衬图像。作为概念验证，我们首次展示了一种宽场无透镜片上仪器，能够成功地在无需任何特殊或复杂的样品制备，或使用孔径合成或基于移位的技术的情况下，在约 30mm 的大视场中检测到 300nm 的粒子。
