Huang Yuan-Qing, Huang Rong, Liu Qing-Lu, Zheng Chang-Cheng, Ning Ji-Qiang, Peng Yong, Zhang Zi-Yang
School of Physical Sciences and Technology, Lanzhou University, 730000, Lanzhou, People's Republic of China.
Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, 215123, Suzhou, People's Republic of China.
Nanoscale Res Lett. 2017 Dec;12(1):12. doi: 10.1186/s11671-016-1780-3. Epub 2017 Jan 5.
In this paper, we demonstrated the fabrication of one-dimensional (1D) and two-dimensional (2D) periodic nanostructures on III-V GaAs substrates utilizing laser direct writing (LDW) technique. Metal thin films (Ti) and phase change materials (GeSbTe (GST) and GeSbBiTe (GSBT)) were chosen as photoresists to achieve small feature sizes of semiconductor nanostructures. A minimum feature size of about 50 nm about a quarter of the optical diffraction limit was obtained on the photoresists, and 1D III-V semiconductor nanolines with a minimum width of 150 nm were successfully acquired on the GaAs substrate which was smaller than the best results acquired on Si substrate ever reported. 2D nanosquare holes were fabricated as well by using Ti thin film as the photoresist, with a side width of about 200 nm, but the square holes changed to a rectangle shape when GST or GSBT was employed as the photoresist, which mainly resulted from the interaction of two cross-temperature fields induced by two scanning laser beams. The interacting mechanism of different photoresists in preparing periodic nanostructures with the LDW technique was discussed in detail.
在本文中,我们展示了利用激光直写(LDW)技术在III-V族砷化镓衬底上制备一维(1D)和二维(2D)周期性纳米结构。选择金属薄膜(Ti)和相变材料(GeSbTe(GST)和GeSbBiTe(GSBT))作为光刻胶,以实现半导体纳米结构的小特征尺寸。在光刻胶上获得了约50nm的最小特征尺寸,约为光学衍射极限的四分之一,并且在砷化镓衬底上成功获得了最小宽度为150nm的一维III-V族半导体纳米线,该尺寸小于以往在硅衬底上所获得的最佳结果。通过使用Ti薄膜作为光刻胶,还制备了边长约为200nm的二维纳米方孔,但当使用GST或GSBT作为光刻胶时,方孔变为矩形,这主要是由两束扫描激光束诱导的两个交叉温度场的相互作用导致的。详细讨论了不同光刻胶在利用LDW技术制备周期性纳米结构中的相互作用机制。