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大规模、大尺寸、少层 α-MoO 在 SiO 上的生长及其光响应机制。

Growth of Large-Scale, Large-Size, Few-Layered α-MoO on SiO and Its Photoresponse Mechanism.

机构信息

Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong , Hong Kong SAR, P.R. China.

Engineering Research Center of IoT Technology Applications (Ministry of Education), Department of Electronic Engineering, Jiangnan University , Wuxi, Jiangsu 214122, P.R. China.

出版信息

ACS Appl Mater Interfaces. 2017 Feb 15;9(6):5543-5549. doi: 10.1021/acsami.6b13743. Epub 2017 Feb 6.

Abstract

Layered α-MoO is a multifunctional material that has significant application in optoelectronic devices. In this study, we show the growth of large-scale, large-size, few-layered (FL) α-MoO nanosheet directly on technical substrates (SiO and Si) by physical vapor deposition. We suggest that the growth is self-limiting in the [010] direction because of the re-evaporation and high diffusion capacity of MoO species at high temperature. As-prepared FL α-MoO is nonconductive and shows poor response to photoillumination with wavelength of 405 and 630 nm. Its work function is strongly altered by the substrate. Improvement of conductivity and photoresponse is observed after the FL device is annealed in vacuum. Line defects along the [001], [100], and [101] directions belonging to the generation of O and O vacancy states appear, and the interfacial effect is suppressed. Scanning near-field optical microscope shows that the defects are absorption sites. Kelvin probe force microscope reveals decrease of apparent work function under illumination, which confirms that electrons are excited from defects states. Our findings show that intense studies on defect engineering are required to push forward the application of two-dimensional metal oxides.

摘要

层状 α-MoO 是一种多功能材料,在光电器件中有重要的应用。在这项研究中,我们通过物理气相沉积法在技术基底(SiO 和 Si)上直接生长出大尺寸、大尺寸、少层(FL)α-MoO 纳米片。我们提出,由于 MoO 物种在高温下的再蒸发和高扩散能力,生长在[010]方向是自限制的。所制备的 FL α-MoO 是不导电的,对波长为 405nm 和 630nm 的光照射的响应很差。其功函数强烈地受到基底的影响。在真空退火后,FL 器件的导电性和光响应得到改善。沿[001]、[100]和[101]方向出现线缺陷,属于 O 和 O 空位态的产生,界面效应得到抑制。扫描近场光学显微镜显示缺陷是吸收位点。开尔文探针力显微镜显示光照下的表观功函数下降,这证实了电子是从缺陷态激发出来的。我们的发现表明,需要对缺陷工程进行深入研究,以推动二维金属氧化物的应用。

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