Department of Civil and Environmental Engineering, New Jersey Institute of Technology, Newark, NJ, 07102, USA.
Small. 2017 Mar;13(11). doi: 10.1002/smll.201603525. Epub 2017 Jan 25.
Atomic force microscopy (AFM) has evolved to be one of the most powerful tools for the characterization of material surfaces especially at the nanoscale. Recent development of AFM has incorporated a suite of analytical techniques including surface-enhanced Raman scattering (SERS) technique and infrared (IR) spectroscopy to further reveal chemical composition and map the chemical distribution. This incorporation not only elevates the functionality of AFM but also increases the resolution limitation of conventional IR and Raman spectroscopy. Despite the rapid development of such hybrid AFM techniques, many unique features, principles, applications, potential pitfalls or artifacts are not well known to the community. This review systematically summarizes the recent relevant literature on hybrid AFM principles and applications. It focuses specially on AFM-IR and AFM-Raman techniques. Various applications in different research fields are critically reviewed and discussed, highlighting the potentials of these hybrid AFM techniques. Here, the major drawbacks and limitations of these two hybrid AFM techniques are presented. The intentions of this article are to shed new light on the future research and achieve improvements in stability and reliability of the measurements.
原子力显微镜（AFM）已发展成为材料表面特性分析，特别是纳米尺度分析的最有力工具之一。AFM 的最新发展结合了一系列分析技术，包括表面增强拉曼散射（SERS）技术和红外（IR）光谱，以进一步揭示化学成分并绘制化学分布。这种结合不仅提升了 AFM 的功能，还提高了传统 IR 和拉曼光谱的分辨率限制。尽管这种混合 AFM 技术发展迅速，但许多独特的特点、原理、应用、潜在的陷阱或伪影并没有被业界所熟知。本文系统地总结了关于混合 AFM 原理和应用的最新相关文献。它特别关注 AFM-IR 和 AFM-Raman 技术。本文对不同研究领域的各种应用进行了批判性的回顾和讨论，突出了这些混合 AFM 技术的潜力。这里介绍了这两种混合 AFM 技术的主要缺点和局限性。本文的目的是为未来的研究提供新的思路，并提高测量的稳定性和可靠性。
