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基于数字微镜的共聚焦显微镜中的高速无波前传感器像差校正

High speed wavefront sensorless aberration correction in digital micromirror based confocal microscopy.

作者信息

Pozzi P, Wilding D, Soloviev O, Verstraete H, Bliek L, Vdovin G, Verhaegen M

出版信息

Opt Express. 2017 Jan 23;25(2):949-959. doi: 10.1364/OE.25.000949.

Abstract

The quality of fluorescence microscopy images is often impaired by the presence of sample induced optical aberrations. Adaptive optical elements such as deformable mirrors or spatial light modulators can be used to correct aberrations. However, previously reported techniques either require special sample preparation, or time consuming optimization procedures for the correction of static aberrations. This paper reports a technique for optical sectioning fluorescence microscopy capable of correcting dynamic aberrations in any fluorescent sample during the acquisition. This is achieved by implementing adaptive optics in a non conventional confocal microscopy setup, with multiple programmable confocal apertures, in which out of focus light can be separately detected, and used to optimize the correction performance with a sampling frequency an order of magnitude faster than the imaging rate of the system. The paper reports results comparing the correction performances to traditional image optimization algorithms, and demonstrates how the system can compensate for dynamic changes in the aberrations, such as those introduced during a focal stack acquisition though a thick sample.

摘要

荧光显微镜图像的质量常常因样品引起的光学像差而受损。诸如可变形镜或空间光调制器等自适应光学元件可用于校正像差。然而,先前报道的技术要么需要特殊的样品制备,要么需要耗时的优化程序来校正静态像差。本文报道了一种光学切片荧光显微镜技术,该技术能够在采集过程中校正任何荧光样品中的动态像差。这是通过在一个非传统的共聚焦显微镜设置中实施自适应光学来实现的,该设置具有多个可编程共聚焦孔径,其中离焦光可以被单独检测,并用于以比系统成像速率快一个数量级的采样频率优化校正性能。本文报道了将校正性能与传统图像优化算法进行比较的结果,并展示了该系统如何补偿像差的动态变化,例如在通过厚样品进行焦平面堆叠采集期间引入的像差。

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