Wright Christopher J, Zhou Xiao Dong
Department of Chemical Engineering, University of South Carolina, Columbia, SC 29208, USA.
J Synchrotron Radiat. 2017 Mar 1;24(Pt 2):506-508. doi: 10.1107/S1600577517000157. Epub 2017 Jan 30.
Area detectors have become the predominant type of detector for the rapid acquisition of X-ray diffraction, small-angle scattering and total scattering. These detectors record the scattering for a large area, giving each shot good statistical significance to the resulting scattered intensity I(Q) pattern. However, many of these detectors have pixel level defects, which cause error in the resulting one-dimensional patterns. In this work, new software to automatically find and mask these dead pixels and other defects is presented. This algorithm is benchmarked with both ideal simulated and experimental datasets.
面探测器已成为快速采集X射线衍射、小角散射和全散射数据的主要探测器类型。这些探测器记录大面积的散射情况，使得每次测量对所得散射强度I(Q)模式具有良好的统计意义。然而，许多这类探测器存在像素级缺陷，这会在所得的一维模式中产生误差。在这项工作中，提出了一种用于自动查找和屏蔽这些死像素及其他缺陷的新软件。该算法在理想模拟数据集和实验数据集上均进行了基准测试。
