Institute of Microelectronics, Peking University, Beijing 100871, China.
The Key Laboratory of Integrated Microsystems, Peking University Shenzhen Graduate School, Shenzhen 518055, China.
Sci Rep. 2017 Mar 24;7:45233. doi: 10.1038/srep45233.
Resistive switching memory (RRAM) is considered as one of the most promising devices for parallel computing solutions that may overcome the von Neumann bottleneck of today's electronic systems. However, the existing RRAM-based parallel computing architectures suffer from practical problems such as device variations and extra computing circuits. In this work, we propose a novel parallel computing architecture for pattern recognition by implementing k-nearest neighbor classification on metal-oxide RRAM crossbar arrays. Metal-oxide RRAM with gradual RESET behaviors is chosen as both the storage and computing components. The proposed architecture is tested by the MNIST database. High speed (~100 ns per example) and high recognition accuracy (97.05%) are obtained. The influence of several non-ideal device properties is also discussed, and it turns out that the proposed architecture shows great tolerance to device variations. This work paves a new way to achieve RRAM-based parallel computing hardware systems with high performance.
阻变存储器 (RRAM) 被认为是最有前途的用于并行计算解决方案的设备之一,它可能克服当今电子系统的冯·诺依曼瓶颈。然而,现有的基于 RRAM 的并行计算架构存在器件变化和额外计算电路等实际问题。在这项工作中,我们通过在金属氧化物 RRAM 交叉阵列上实现 k-最近邻分类,提出了一种用于模式识别的新型并行计算架构。具有渐进重置行为的金属氧化物 RRAM 被选为存储和计算组件。所提出的架构通过 MNIST 数据库进行了测试。获得了高速(每个示例约 100 ns)和高识别精度(97.05%)。还讨论了几种非理想器件特性的影响,结果表明,所提出的架构对器件变化具有很强的容忍度。这项工作为实现具有高性能的基于 RRAM 的并行计算硬件系统开辟了新途径。