通过稳态红外热成像法测量面内热导率。
Measurement of the in-plane thermal conductivity by steady-state infrared thermography.
作者信息
Greppmair Anton, Stoib Benedikt, Saxena Nitin, Gerstberger Caroline, Müller-Buschbaum Peter, Stutzmann Martin, Brandt Martin S
机构信息
Walter Schottky Institut and Physik-Department, Technische Universität München, Am Coulombwall 4,85748 Garching, Germany.
Lehrstuhl für Funktionelle Materialien, Physik-Department, Technische Universität München, James-Franck-Strasse 1, 85748 Garching, Germany.
出版信息
Rev Sci Instrum. 2017 Apr;88(4):044903. doi: 10.1063/1.4979564.
We demonstrate a simple and quick method for the measurement of the in-plane thermal conductance of thin films via steady-state IR thermography. The films are suspended above a hole in an opaque substrate and heated by a homogeneous visible light source. The temperature distribution of the thin films is captured via infrared microscopy and fitted to the analytical expression obtained for the specific hole geometry in order to obtain the in-plane thermal conductivity. For thin films of poly(3,4-ethylenedioxythiophene):polystyrene sulfonate post-treated with ethylene glycol and of polyimide, we find conductivities of 1.0 W m K and 0.4 W m K at room temperature, respectively. These results are in very good agreement with literature values, validating the method developed.
我们展示了一种通过稳态红外热成像测量薄膜面内热导率的简单快速方法。薄膜悬浮在不透明基板上的一个孔上方，并由均匀可见光源加热。通过红外显微镜捕获薄膜的温度分布，并将其拟合为针对特定孔几何形状获得的解析表达式，以获得面内热导率。对于用乙二醇后处理的聚（3,4 - 乙撑二氧噻吩）：聚苯乙烯磺酸盐薄膜和聚酰亚胺薄膜，我们在室温下分别测得热导率为1.0 W m⁻¹ K⁻¹ 和0.4 W m⁻¹ K⁻¹ 。这些结果与文献值非常吻合，验证了所开发的方法。
Zotero 插件