Ranger Nicole T, Samei Ehsan, Dobbins James T, Ravin Carl E
Duke Advanced Imaging Laboratories, Department of Radiology, Duke University, Durham, North Carolina 27710.
Duke Advanced Imaging Laboratories, Department of Radiology, Departments of Biomedical Engineering and Physics, Duke University, Durham, North Carolina 27710.
Med Phys. 2005 Jul;32(7Part1):2305-2311. doi: 10.1118/1.1929187.
As part of a larger evaluation we attempted to measure the detective quantum efficiency (DQE) of an amorphous silicon flat-panel detector using the method described in the International Electrotechnical Commission standard 62220-1 published in October 2003. To achieve the radiographic beam conditions specified in the standard, we purchased scientific-grade ultrahigh purity aluminum (99.999% purity, type-11999 alloy) filters in thicknesses ranging from 0.1 through 10.0 mm from a well-known, specialty metals supplier. Qualitative evaluation of flat field images acquired at 71 kV (RQA5 beam quality) with 21 mm of ultrahigh purity aluminum filtration demonstrated a low frequency mottle that was reproducible and was not observed when the measurement was repeated at 74 kV (RQA5 beam quality) with 21 mm of lower-purity aluminum (99.0% purity, type-1100 alloy) filtration. This finding was ultimately attributed to the larger grain size (approximately 1-2 mm) of high purity aluminum metal, which is a well-known characteristic, particularly in thicknesses greater than 1 mm. The impact of this low frequency mottle is to significantly overestimate the noise power spectrum (NPS) at spatial frequencies ⩽0.2mm-1, which in turn would cause an underestimation of the DQE in this range. A subsequent evaluation of ultrahigh purity aluminum, purchased from a second source, suggests, that reduced grain size can be achieved by the process of annealing. Images acquired with this sample demonstrated vertical striated nonuniformities that are attributed to the manufacturing method and which do not appear to appreciably impact the NPS at spatial frequencies ⩾0.5mm-1, but do result in an asymmetry in the x- and y-NPS at spatial frequencies ⩽0.2mm-1. Our observations of markedly visible nonuniformities in images acquired with high purity aluminum filtration suggest that the uniformity of filter materials should be carefully evaluated and taken into consideration when measuring the DQE.
作为一项更大规模评估的一部分,我们尝试使用国际电工委员会2003年10月发布的标准62220-1中描述的方法,来测量非晶硅平板探测器的探测量子效率(DQE)。为达到该标准中规定的射线束条件,我们从一家知名的特种金属供应商处购买了厚度从0.1毫米到10.0毫米不等的科学级超高纯铝(纯度99.999%,11999型合金)滤片。在71 kV(RQA5射线质)下,使用21毫米超高纯铝滤过采集的平板场图像的定性评估显示出一种低频斑点,该斑点具有可重复性,并且当在74 kV(RQA5射线质)下使用21毫米较低纯度铝(纯度99.0%,1100型合金)滤过重复测量时未观察到。这一发现最终归因于高纯度铝金属较大的晶粒尺寸(约1 - 2毫米),这是一个众所周知的特性,尤其是在厚度大于1毫米时。这种低频斑点的影响是在空间频率≤0.2mm⁻¹时显著高估噪声功率谱(NPS),这反过来会导致该范围内DQE的低估。随后对从第二个来源购买的超高纯铝进行的评估表明,通过退火工艺可以减小晶粒尺寸。用该样品采集的图像显示出垂直条纹状不均匀性,这归因于制造方法,并且在空间频率≥0.5mm⁻¹时似乎对NPS没有明显影响,但在空间频率≤0.2mm⁻¹时确实会导致x和y方向NPS的不对称。我们对使用高纯度铝滤过采集的图像中明显可见的不均匀性的观察表明,在测量DQE时,应仔细评估并考虑滤材的均匀性。