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用于近场介电成像的环形谐振器介质探针。

A Split Ring Resonator Dielectric Probe for Near-Field Dielectric Imaging.

机构信息

University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK.

University of Oxford, Department of Engineering Science, Parks Road, Oxford, OX1 3PJ, UK.

出版信息

Sci Rep. 2017 May 17;7(1):2038. doi: 10.1038/s41598-017-02176-3.

Abstract

A single split-ring resonator (SRR) probe for 2D surface mapping and imaging of relative dielectric permittivity for the characterisation of composite materials has been developed. The imaging principle, the analysis and the sensitivity of the SRR surface dielectric probe data is described. The surface dielectric properties of composite materials in the frequency range 1-3 GHz have been measured based on the magnetic resonance frequency of the transmission loss of the SRR dielectric probe when in contact with the surface. The SRR probe performance was analysed analytically and using full-wave simulation, and predictions showed close agreement with experiment for composite materials with spatially varying dielectric permittivity manufactured by 3D printing. The spatial and permittivity resolution of the SRR dielectric probe were controlled by the geometrical parameters of the SRR which provided flexibility to tune the SRR probe. The best accuracy of the dielectric permittivity measurements was within 5%.

摘要

已经开发出一种用于二维表面测绘和相对介电常数成像的单个环形谐振器 (SRR) 探头,用于复合材料的特性分析。本文描述了 SRR 表面介电探头数据的成像原理、分析和灵敏度。基于 SRR 介电探头在接触表面时传输损耗的磁共振频率,测量了复合材料在 1-3GHz 频率范围内的表面介电性能。通过全波模拟对 SRR 探头性能进行了分析和预测,实验结果表明,对于通过 3D 打印制造的空间变化介电常数的复合材料,预测结果与实验结果非常吻合。SRR 介电探头的空间分辨率和介电常数分辨率由 SRR 的几何参数控制,这为调整 SRR 探头提供了灵活性。介电常数测量的最佳精度在 5%以内。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9a03/5435736/b6f89f946419/41598_2017_2176_Fig1_HTML.jpg

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