Boandoh Stephen, Choi Soo Ho, Park Ji-Hoon, Park So Young, Bang Seungho, Jeong Mun Seok, Lee Joo Song, Kim Hyeong Jin, Yang Woochul, Choi Jae-Young, Kim Soo Min, Kim Ki Kang
Department of Energy and Materials Engineering, Dongguk University-Seoul, Seoul, 04620, Republic of Korea.
Department of Physics, Dongguk University-Seoul, Seoul, 04620, Republic of Korea.
Small. 2017 Oct;13(39). doi: 10.1002/smll.201701306. Epub 2017 Aug 22.
High-quality and large-area molybdenum disulfide (MoS ) thin film is highly desirable for applications in large-area electronics. However, there remains a challenge in attaining MoS film of reasonable crystallinity due to the absence of appropriate choice and control of precursors, as well as choice of suitable growth substrates. Herein, a novel and facile route is reported for synthesizing few-layered MoS film with new precursors via chemical vapor deposition. Prior to growth, an aqueous solution of sodium molybdate as the molybdenum precursor is spun onto the growth substrate and dimethyl disulfide as the liquid sulfur precursor is supplied with a bubbling system during growth. To supplement the limiting effect of Mo (sodium molybdate), a supplementary Mo is supplied by dissolving molybdenum hexacarbonyl (Mo(CO) ) in the liquid sulfur precursor delivered by the bubbler. By precisely controlling the amounts of precursors and hydrogen flow, full coverage of MoS film is readily achievable in 20 min. Large-area MoS field effect transistors (FETs) fabricated with a conventional photolithography have a carrier mobility as high as 18.9 cm V s , which is the highest reported for bottom-gated MoS -FETs fabricated via photolithography with an on/off ratio of ≈10 at room temperature.
高质量大面积的二硫化钼(MoS₂)薄膜在大面积电子器件应用中极具吸引力。然而,由于缺乏对前驱体的恰当选择和控制以及合适生长衬底的选择,要获得具有合理结晶度的MoS₂薄膜仍然存在挑战。在此,报道了一种新颖且简便的方法,通过化学气相沉积法使用新的前驱体合成少层MoS₂薄膜。在生长之前,将作为钼前驱体的钼酸钠水溶液旋涂到生长衬底上,并在生长过程中通过鼓泡系统供应作为液态硫前驱体的二甲基二硫。为了补充Mo(钼酸钠)的限制作用,通过将六羰基钼(Mo(CO)₆)溶解在由鼓泡器输送的液态硫前驱体中来供应补充的Mo。通过精确控制前驱体的量和氢气流量,在20分钟内很容易实现MoS₂薄膜的完全覆盖。用传统光刻法制造的大面积MoS₂场效应晶体管(FET)的载流子迁移率高达18.9 cm² V⁻¹ s⁻¹,这是通过光刻法制造的底部栅极MoS₂ - FET在室温下报道的最高值,其开/关比约为10。