School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju, 61005, South Korea.
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin, 53706, USA.
Sci Rep. 2017 Aug 30;7(1):9994. doi: 10.1038/s41598-017-10383-1.
Fabrication of epitaxial FeSeTe thin films using pulsed laser deposition (PLD) enables improving their superconducting transition temperature (T ) by more than ~40% than their bulk T . Intriguingly, T enhancement in FeSeTe thin films has been observed on various substrates and with different Se content, x. To date, various mechanisms for T enhancement have been reported, but they remain controversial in universally explaining the T improvement in the FeSeTe films. In this report, we demonstrate that the controversies over the mechanism of T enhancement are due to the abnormal changes in the chalcogen ratio (Se:Te) during the film growth and that the previously reported T enhancement in FeSeTe thin films is caused by a remarkable increase of Se content. Although our FeSeTe thin films were fabricated via PLD using a FeSeTe target, the precisely measured composition indicates a Se-rich FeSeTe (0.6 < x < 0.8) as ascertained through accurate compositional analysis by both wavelength dispersive spectroscopy (WDS) and Rutherford backscattering spectrometry (RBS). We suggest that the origin of the abnormal composition change is the difference in the thermodynamic properties of ternary FeSeTe, based on first principle calculations.
采用脉冲激光沉积(PLD)方法制备外延 FeSeTe 薄膜,可以将其超导转变温度(T)提高超过~40%,超过其体材料的 T。有趣的是,在各种衬底上和不同的硒含量(x)下,都观察到了 FeSeTe 薄膜的 T 增强。迄今为止,已经报道了各种 T 增强机制,但它们在普遍解释 FeSeTe 薄膜的 T 改善方面仍然存在争议。在本报告中,我们证明了 T 增强机制的争议是由于在薄膜生长过程中硫属元素比(Se:Te)的异常变化引起的,并且先前报道的 FeSeTe 薄膜中的 T 增强是由于硒含量的显著增加引起的。尽管我们的 FeSeTe 薄膜是通过使用 FeSeTe 靶材的 PLD 方法制备的,但是通过波长色散光谱(WDS)和卢瑟福背散射光谱(RBS)的精确成分分析表明,薄膜的组成实际上是富硒的 FeSeTe(0.6<x<0.8)。我们基于第一性原理计算提出,这种异常成分变化的起源是三元 FeSeTe 热力学性质的差异。