Schoenherr Peggy, Giraldo L Marcela, Lilienblum Martin, Trassin Morgan, Meier Dennis, Fiebig Manfred
Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, 8093 Zürich, Switzerland.
Department of Materials Science and Engineering, Norwegian University of Science and Technology, Sem Sælandsvei 12, 7034 Trondheim, Norway.
Materials (Basel). 2017 Sep 7;10(9):1051. doi: 10.3390/ma10091051.
Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 ∘ variety. As reference compound for this investigation we use Cr 2 O 3 . Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 ∘ domain states of Cr 2 O 3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.
磁电式力显微镜（MeFM）是一种用于研究反铁磁畴状态，特别是180°反铁磁畴状态的系统工具。作为该研究的参考化合物，我们使用Cr₂O₃。线性磁电效应为研究反铁磁序提供了途径。我们分辨出Cr₂O₃相反的180°反铁磁畴状态，并评估了MeFM方法的灵敏度、与其他技术相比的固有优势以及探测反铁磁序的总体可行性。
