Rawlings Colin D, Zientek Michal, Spieser Martin, Urbonas Darius, Stöferle Thilo, Mahrt Rainer F, Lisunova Yuliya, Brugger Juergen, Duerig Urs, Knoll Armin W
IBM Research-Zurich, Rüschlikon, Switzerland.
SwissLitho AG, Technoparkstrasse 1, Zurich, Switzerland.
Sci Rep. 2017 Nov 28;7(1):16502. doi: 10.1038/s41598-017-16496-x.
Applications for high resolution 3D profiles, so-called grayscale lithography, exist in diverse fields such as optics, nanofluidics and tribology. All of them require the fabrication of patterns with reliable absolute patterning depth independent of the substrate location and target materials. Here we present a complete patterning and pattern-transfer solution based on thermal scanning probe lithography (t-SPL) and dry etching. We demonstrate the fabrication of 3D profiles in silicon and silicon oxide with nanometer scale accuracy of absolute depth levels. An accuracy of less than 1nm standard deviation in t-SPL is achieved by providing an accurate physical model of the writing process to a model-based implementation of a closed-loop lithography process. For transfering the pattern to a target substrate we optimized the etch process and demonstrate linear amplification of grayscale patterns into silicon and silicon oxide with amplification ratios of ∼6 and ∼1, respectively. The performance of the entire process is demonstrated by manufacturing photonic molecules of desired interaction strength. Excellent agreement of fabricated and simulated structures has been achieved.
高分辨率3D轮廓(即所谓的灰度光刻)的应用存在于光学、纳米流体和摩擦学等不同领域。所有这些应用都需要制造出具有可靠绝对图案化深度的图案,且该深度与衬底位置和目标材料无关。在此,我们展示了一种基于热扫描探针光刻(t-SPL)和干法蚀刻的完整图案化及图案转移解决方案。我们演示了在硅和氧化硅中制造具有纳米级绝对深度精度的3D轮廓。通过将写入过程的精确物理模型提供给基于模型的闭环光刻过程实现,在t-SPL中实现了小于1nm的标准偏差精度。为了将图案转移到目标衬底上,我们优化了蚀刻工艺,并演示了将灰度图案分别以约6和约1的放大率线性放大到硅和氧化硅中。通过制造具有所需相互作用强度的光子分子证明了整个过程的性能。所制造的结构与模拟结构实现了极佳的吻合。