Kuehlewein Laura, Kitiratschky Veronique, Gosheva Mariya, Edwards Thomas L, MacLaren Robert E, Groppe Markus, Kusnyerik Akos, Soare Cristina, Jackson Timothy L, Sun Chen-Hsin, Chee Caroline, Sachs Helmut, Stingl Krunoslav, Wilhelm Barbara, Gekeler Florian, Bartz-Schmidt Karl Ulrich, Zrenner Eberhart, Stingl Katarina
Ophthalmic Surg Lasers Imaging Retina. 2017 Dec 1;48(12):993-999. doi: 10.3928/23258160-20171130-06.
The aim of this study was to assess changes in retinal structure and thickness after subretinal implantation of the Retina Implant Alpha IMS (Retina Implant AG, Reutlingen, Germany).
Spectral-domain optical coherence tomography (SD-OCT) imaging was performed to assess the structure and thickness of the retina anterior to the microphotodiode array preoperatively, within 6 weeks and 6 months ± 1 month after implantation. Thickness measurements were performed using the distance tool of the built-in software. Three thickness measurements were performed in each of the four quadrants of the retina on the microchip within 6 weeks and 6 months ± 1 month after implantation.
The mean ± standard deviation change in retinal thickness from within 6 weeks to 6 months ± 1 month after implantation in all four quadrants combined was 24 μm ± 68 μm. None of the tested variables (location, time, or their interaction) had a statistically significant effect on the mean retinal thickness (P = .961, P = .131, and P = .182, respectively; n = 19).
The authors report on qualitative and quantitative findings in retinal structure in 27 patients after subretinal implantation of the Retina Implant Alpha IMS using OCT technology. No significant changes of retinal thickness could be observed in a period of 6 months after surgery. With more patients receiving subretinal implants and with advanced OCT technology, the data set will be extended to study possible changes in retinal structure in finer detail. [Ophthalmic Surg Lasers Imaging Retina. 2017;48:993-999.].
本研究旨在评估视网膜植入物Alpha IMS（德国罗伊特林根Retina Implant AG公司）视网膜下植入术后视网膜结构和厚度的变化。
采用光谱域光学相干断层扫描（SD-OCT）成像技术，在术前、植入后6周内以及植入后6个月±1个月时，评估微型光电二极管阵列前方视网膜的结构和厚度。使用内置软件的距离工具进行厚度测量。在植入后6周内以及植入后6个月±1个月时，对芯片上视网膜的四个象限分别进行三次厚度测量。
植入后6周内至6个月±1个月时，四个象限视网膜厚度的平均±标准差变化为24μm±68μm。所有测试变量（位置、时间或它们的相互作用）对平均视网膜厚度均无统计学显著影响（P分别为0.961、0.131和0.182；n = 19）。
作者报告了27例患者在视网膜下植入Retina Implant Alpha IMS后，使用OCT技术对视网膜结构进行的定性和定量研究结果。术后6个月内未观察到视网膜厚度有明显变化。随着更多患者接受视网膜下植入以及OCT技术的进步，数据集将得到扩展，以便更详细地研究视网膜结构的可能变化。[《眼科手术、激光与影像学杂志》。2017；48：993 - 999。]
