Li Heyang Thomas, Kingston Andrew M, Myers Glenn R, Beeching Levi, Sheppard Adrian P
J Opt Soc Am A Opt Image Sci Vis. 2018 Jan 1;35(1):A30-A39. doi: 10.1364/JOSAA.35.000A30.
Near-field x-ray refraction (phase) contrast is unavoidable in many lab-based micro-CT imaging systems. Quantitative analysis of x-ray refraction (a.k.a. phase retrieval) is in general an under-constrained problem. Regularizing assumptions may not hold true for interesting samples; popular single-material methods are inappropriate for heterogeneous samples, leading to undesired blurring and/or over-sharpening. In this paper, we constrain and solve the phase-retrieval problem for heterogeneous objects, using the Alvarez-Macovski model for x-ray attenuation. Under this assumption we neglect Rayleigh scattering and pair production, considering only Compton scattering and the photoelectric effect. We formulate and test the resulting method to extract the material properties of density and atomic number from single-distance, dual-energy imaging of both strongly and weakly attenuating multi-material objects with polychromatic x-ray spectra. Simulation and experimental data are used to compare our proposed method with the Paganin single-material phase-retrieval algorithm, and an innovative interpretation of the data-constrained modeling phase-retrieval technique.
在许多基于实验室的微型计算机断层扫描(micro-CT)成像系统中,近场X射线折射(相位)对比度是不可避免的。X射线折射的定量分析(也称为相位恢复)通常是一个约束不足的问题。对于感兴趣的样本,正则化假设可能不成立;流行的单一材料方法不适用于异质样本,会导致不期望的模糊和/或过度锐化。在本文中,我们使用阿尔瓦雷斯 - 马科夫斯基(Alvarez-Macovski)X射线衰减模型,对异质物体的相位恢复问题进行约束和求解。在此假设下,我们忽略瑞利散射和电子对产生,仅考虑康普顿散射和光电效应。我们制定并测试了由此产生的方法,以从具有多色X射线光谱的强衰减和弱衰减多材料物体的单距离、双能成像中提取密度和原子序数的材料特性。使用模拟和实验数据将我们提出的方法与帕加宁(Paganin)单一材料相位恢复算法以及数据约束建模相位恢复技术的创新解释进行比较。