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原子分辨透射电子显微镜观察电子束敏感的晶体材料。

Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials.

机构信息

King Abdullah University of Science and Technology (KAUST), Imaging and Characterization Core Lab, Thuwal 23955-6900, Saudi Arabia.

KAUST, Advanced Membranes and Porous Materials Center, Physical Sciences and Engineering Division, Thuwal 23955-6900, Saudi Arabia.

出版信息

Science. 2018 Feb 9;359(6376):675-679. doi: 10.1126/science.aao0865. Epub 2018 Jan 18.

DOI:10.1126/science.aao0865
PMID:29348363
Abstract

High-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam-sensitive materials, including the organic-inorganic hybrid perovskite CHNHPbBr.

摘要

高分辨率成像的电子束敏感材料是最困难的应用之一透射电子显微镜(TEM)。面临的挑战是多方面的,包括获取图像具有极低的束剂量,时间受限的搜索晶体晶带轴,精确的图像对齐,以及准确确定散焦值。我们开发了一套方法来满足这些要求,并获得几个金属有机骨架的原子分辨率 TEM 图像,这些骨架通常被认为对电子束非常敏感。高的图像分辨率使我们能够识别个别金属原子列,各种类型的表面终止,和在有机连接物中的苯环。我们还将我们的方法应用于其他电子束敏感材料,包括有机-无机杂化钙钛矿 CHNHPbBr。

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