Saeidi Ali, Jazaeri Farzan, Stolichnov Igor, Luong Gia V, Zhao Qing-Tai, Mantl Siegfried, Ionescu Adrian M
Ecole Polytechnique Federale de Lausanne (EPFL), Lausanne, Switzerland.
Nanotechnology. 2018 Mar 2;29(9):095202. doi: 10.1088/1361-6528/aaa590.
This work experimentally demonstrates that the negative capacitance effect can be used to significantly improve the key figures of merit of tunnel field effect transistor (FET) switches. In the proposed approach, a matching condition is fulfilled between a trained-polycrystalline PZT capacitor and the tunnel FET (TFET) gate capacitance fabricated on a strained silicon-nanowire technology. We report a non-hysteretic switch configuration by combining a homojunction TFET and a negative capacitance effect booster, suitable for logic applications, for which the on-current is increased by a factor of 100, the transconductance by 2 orders of magnitude, and the low swing region is extended. The operation of a hysteretic negative capacitance TFET, when the matching condition for the negative capacitance is fulfilled only in a limited region of operation, is also reported and discussed. In this late case, a limited improvement in the device performance is observed. Overall, the paper demonstrates the main beneficial effects of negative capacitance on TFETs are the overdrive and transconductance amplification, which exactly address the most limiting performances of current TFETs.
这项工作通过实验证明,负电容效应可用于显著改善隧道场效应晶体管(FET)开关的关键性能指标。在所提出的方法中,在经过训练的多晶PZT电容器与基于应变硅纳米线技术制造的隧道FET(TFET)栅极电容之间实现了匹配条件。我们报告了一种通过结合适用于逻辑应用的同质结TFET和负电容效应增强器实现的无滞后开关配置,其导通电流增加了100倍,跨导增加了2个数量级,并且低摆幅区域得到扩展。还报告并讨论了仅在有限的工作区域满足负电容匹配条件时滞后负电容TFET的工作情况。在这种情况下,观察到器件性能有有限的改善。总体而言,本文表明负电容对TFET的主要有益影响是过驱动和跨导放大,这恰好解决了当前TFET最具限制的性能问题。