a Department of Physiology & Pharmacology , the Sackler Faculty of Medicine and Sagol School of Neurosciences, Tel Aviv University , Tel Aviv , Israel.
Channels (Austin). 2018 Jan 1;12(1):89-99. doi: 10.1080/19336950.2018.1441649.
Inactivation is an intrinsic property of numerous voltage-gated K (Kv) channels and can occur by N-type or/and C-type mechanisms. N-type inactivation is a fast, voltage independent process, coupled to activation, with each inactivation particle of a tetrameric channel acting independently. In N-type inactivation, a single inactivation particle is necessary and sufficient to occlude the pore. C-type inactivation is a slower process, involving the outermost region of the pore and is mediated by a concerted, highly cooperative interaction between all four subunits. Inactivation of Kv7.1 channels does not exhibit the hallmarks of N- and C-type inactivation. Inactivation of WT Kv7.1 channels can be revealed by hooked tail currents that reflects the recovery from a fast and voltage-independent inactivation process. However, several Kv7.1 mutants such as the pore mutant L273F generate an additional voltage-dependent slow inactivation. The subunit interactions during this slow inactivation gating remain unexplored. The goal of the present study was to study the nature of subunit interactions along Kv7.1 inactivation gating, using concatenated tetrameric Kv7.1 channel and introducing sequentially into each of the four subunits the slow inactivating pore mutation L273F. Incorporating an incremental number of inactivating mutant subunits did not affect the inactivation kinetics but slowed down the recovery kinetics from inactivation. Results indicate that Kv7.1 inactivation gating is not compatible with a concerted cooperative process. Instead, adding an inactivating subunit L273F into the Kv7.1 tetramer incrementally stabilizes the inactivated state, which suggests that like for activation gating, Kv7.1 slow inactivation gating is not a concerted process.
失活是许多电压门控 K(Kv)通道的固有特性,可通过 N 型或/和 C 型机制发生。N 型失活是一种快速、与激活相关的电压非依赖性过程,每个四聚体通道的失活粒子独立作用。在 N 型失活中,单个失活粒子足以阻塞孔道。C 型失活是一个较慢的过程,涉及孔道的最外层区域,由所有四个亚基之间的协调、高度合作的相互作用介导。Kv7.1 通道的失活不表现出 N 型和 C 型失活的特征。WT Kv7.1 通道的失活可以通过钩状尾电流来揭示,反映了从快速和电压非依赖性失活过程中的恢复。然而,几种 Kv7.1 突变体,如 L273F 突变体,会产生额外的电压依赖性缓慢失活。在这种缓慢失活门控过程中亚基相互作用仍未被探索。本研究的目的是使用串联四聚体 Kv7.1 通道研究 Kv7.1 失活门控过程中亚基相互作用的性质,并将缓慢失活的突变 L273F 依次引入到四个亚基中的每一个。引入递增数量的失活突变亚基不会影响失活动力学,但会减缓从失活中恢复的动力学。结果表明,Kv7.1 失活门控与协调合作过程不兼容。相反,将失活亚基 L273F 逐个加入到 Kv7.1 四聚体中逐渐稳定失活状态,这表明与激活门控一样,Kv7.1 缓慢失活门控不是一个协调的过程。