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从介观尺度到纳米尺度的神经解剖学:一种通过高分辨率扫描电子显微镜观察半薄切片的改进方法。

Neuroanatomy from Mesoscopic to Nanoscopic Scales: An Improved Method for the Observation of Semithin Sections by High-Resolution Scanning Electron Microscopy.

作者信息

Rodríguez José-Rodrigo, Turégano-López Marta, DeFelipe Javier, Merchán-Pérez Angel

机构信息

Laboratorio Cajal de Circuitos Corticales, Centro de Tecnología Biomédica, Universidad Politécnica de Madrid (UPM), Madrid, Spain.

Instituto Cajal, Consejo Superior de Investigaciones Científicas (CSIC), Madrid, Spain.

出版信息

Front Neuroanat. 2018 Feb 27;12:14. doi: 10.3389/fnana.2018.00014. eCollection 2018.

Abstract

Semithin sections are commonly used to examine large areas of tissue with an optical microscope, in order to locate and trim the regions that will later be studied with the electron microscope. Ideally, the observation of semithin sections would be from mesoscopic to nanoscopic scales directly, instead of using light microscopy and then electron microscopy (EM). Here we propose a method that makes it possible to obtain high-resolution scanning EM images of large areas of the brain in the millimeter to nanometer range. Since our method is compatible with light microscopy, it is also feasible to generate hybrid light and electron microscopic maps. Additionally, the same tissue blocks that have been used to obtain semithin sections can later be used, if necessary, for transmission EM, or for focused ion beam milling and scanning electron microscopy (FIB-SEM).

摘要

半薄切片通常用于通过光学显微镜检查大面积组织,以便定位和修整随后将用电子显微镜研究的区域。理想情况下,对半薄切片的观察应直接从中观尺度到纳米尺度,而不是先使用光学显微镜然后再用电子显微镜(EM)。在此,我们提出一种方法,该方法能够获得毫米至纳米范围内大面积脑组织的高分辨率扫描电子显微镜图像。由于我们的方法与光学显微镜兼容,生成光镜和电镜混合图谱也是可行的。此外,如果需要,已用于获取半薄切片的相同组织块随后可用于透射电镜检查,或用于聚焦离子束铣削和扫描电子显微镜(FIB-SEM)。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b7fb/5852425/d0f37d0121d2/fnana-12-00014-g0001.jpg

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