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低温电子显微镜中全局和局域辐射损伤分析。

Analysis of Global and Site-Specific Radiation Damage in Cryo-EM.

机构信息

Howard Hughes Medical Institute, University of California, Los Angeles, Los Angeles CA 90095, USA; Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, VA 20147, USA.

Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, VA 20147, USA.

出版信息

Structure. 2018 May 1;26(5):759-766.e4. doi: 10.1016/j.str.2018.03.021. Epub 2018 Apr 26.

DOI:10.1016/j.str.2018.03.021
PMID:29706530
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6333475/
Abstract

Micro-crystal electron diffraction (MicroED) combines the efficiency of electron scattering with diffraction to allow structure determination from nano-sized crystalline samples in cryoelectron microscopy (cryo-EM). It has been used to solve structures of a diverse set of biomolecules and materials, in some cases to sub-atomic resolution. However, little is known about the damaging effects of the electron beam on samples during such measurements. We assess global and site-specific damage from electron radiation on nanocrystals of proteinase K and of a prion hepta-peptide and find that the dynamics of electron-induced damage follow well-established trends observed in X-ray crystallography. Metal ions are perturbed, disulfide bonds are broken, and acidic side chains are decarboxylated while the diffracted intensities decay exponentially with increasing exposure. A better understanding of radiation damage in MicroED improves our assessment and processing of all types of cryo-EM data.

摘要

微晶体电子衍射(MicroED)将电子散射的效率与衍射相结合,使结构测定能够从 cryo-EM(冷冻电子显微镜)中的纳米级晶体样品中进行。它已被用于解决各种生物分子和材料的结构问题,在某些情况下达到了亚原子分辨率。然而,对于电子束在这些测量过程中对样品的破坏作用知之甚少。我们评估了蛋白酶 K 和朊病毒七肽纳米晶体的全局和局部损伤,发现电子诱导损伤的动力学遵循在 X 射线晶体学中观察到的成熟趋势。金属离子受到干扰,二硫键断裂,酸性侧链脱羧,而衍射强度随着暴露时间的增加呈指数衰减。更好地了解 MicroED 中的辐射损伤可以提高我们对所有类型 cryo-EM 数据的评估和处理。

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本文引用的文献

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Atomic-resolution structures from fragmented protein crystals with the cryoEM method MicroED.利用低温电子显微镜方法MicroED获得的片段化蛋白质晶体的原子分辨率结构。
Nat Methods. 2017 Feb 13;14(4):399-402. doi: 10.1038/nmeth.4178.
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Modeling truncated pixel values of faint reflections in MicroED images.对MicroED图像中微弱反射的截断像素值进行建模。
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