Automated reactive accelerated aging for rapid evaluation of neural implant performance.

Novel therapeutic applications for neural implants require miniaturized devices. Miniaturization imposes stricter requirements for reliability of materials. Pilot clinical studies suggest that rapid failure of the miniaturized neural implants in the body presents a major challenge for this type of technology. Traditional evaluations of neural implant performance over clinically relevant durations present time- and resource-intensive experiments in animals. Reactive accelerated aging (RAA) is an test platform that was developed to expedite durability testing of neural implants, as a screening technique designed to simulate the aggressive physiological environment experienced by the implants. This approach employs hydrogen peroxide, which mimics reactive oxygen species, and a high temperature to accelerate chemical reactions that lead to device degradation similar to that found with devices implanted . The original RAA system required daily manual maintenance and was prone to variability in performance. To address these limitations, this work introduces automated reactive accelerated aging (aRAA) with closed-loop monitoring components that make the system simple, robust, and scalable. The core novel technology in the aRAA is electrochemical detection for feedback control of hydrogen peroxide concentration, implemented with simple off-the-shelf components. The aRAA can run multiple parallel experiments for high-throughput device testing and optimization. For this reason, the aRAA provides a simple tool for rapid evaluation of the durability of neural implants, ultimately expediting the development of a new generation of miniaturized devices with a long functional lifespan.