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基于一步无掩模灰度光刻的具有任意表面轮廓的微光学元件制造

Fabrication of Micro-Optics Elements with Arbitrary Surface Profiles Based on One-Step Maskless Grayscale Lithography.

作者信息

Deng Qinyuan, Yang Yong, Gao Hongtao, Zhou Yi, He Yu, Hu Song

机构信息

State Key Laboratory of Optical Technologies for Microfabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China.

University of Chinese Academy of Sciences, Beijing 100049, China.

出版信息

Micromachines (Basel). 2017 Oct 23;8(10):314. doi: 10.3390/mi8100314.

Abstract

A maskless lithography method to realize the rapid and cost-effective fabrication of micro-optics elements with arbitrary surface profiles is reported. A digital micro-mirror device (DMD) is applied to flexibly modulate that the exposure dose according to the surface profile of the structure to be fabricated. Due to the fact that not only the relationship between the grayscale levels of the DMD and the exposure dose on the surface of the photoresist, but also the dependence of the exposure depth on the exposure dose, deviate from a linear relationship arising from the DMD and photoresist, respectively, and cannot be systemically eliminated, complicated fabrication art and large fabrication error will results. A method of compensating the two nonlinear effects is proposed that can be used to accurately design the digital grayscale mask and ensure a precise control of the surface profile of the structure to be fabricated. To testify to the reliability of this approach, several typical array elements with a spherical surface, aspherical surface, and conic surface have been fabricated and tested. The root-mean-square (RMS) between the test and design value of the surface height is about 0.1 μm. The proposed method of compensating the nonlinear effect in maskless lithography can be directly used to control the grayscale levels of the DMD for fabricating the structure with an arbitrary surface profile.

摘要

报道了一种无掩模光刻方法,用于实现具有任意表面轮廓的微光学元件的快速且经济高效的制造。应用数字微镜器件(DMD)根据待制造结构的表面轮廓灵活调制曝光剂量。由于DMD的灰度级与光刻胶表面的曝光剂量之间的关系,以及曝光深度对曝光剂量的依赖性,分别偏离了由DMD和光刻胶产生的线性关系,且无法系统消除,这将导致复杂的制造工艺和较大的制造误差。提出了一种补偿这两种非线性效应的方法,该方法可用于精确设计数字灰度掩模,并确保对待制造结构的表面轮廓进行精确控制。为验证该方法的可靠性,已制造并测试了几种具有球面、非球面和圆锥面的典型阵列元件。表面高度的测试值与设计值之间的均方根(RMS)约为0.1μm。所提出的补偿无掩模光刻中非线性效应的方法可直接用于控制DMD的灰度级,以制造具有任意表面轮廓的结构。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b891/6190032/ac8f744b2407/micromachines-08-00314-g002.jpg

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