Center for Condensed Matter Theory, Department of Physics, Indian Institute of Science, Bangalore 560012, India.
Phys Rev Lett. 2018 Dec 28;121(26):266401. doi: 10.1103/PhysRevLett.121.266401.
Ultraflatbands in twisted bilayers of two-dimensional materials have the potential to host strong correlations, including the Mott-insulating phase at half-filling of the band. Using first-principles density functional theory calculations, we show the emergence of ultraflatbands at the valence band edge in twisted bilayer MoS_{2}, a prototypical transition metal dichalcogenide. The computed band widths, 5 and 23 meV for 56.5° and 3.5° twist angles, respectively, are comparable to that of twisted bilayer graphene near "magic" angles. Large structural transformations in the moiré patterns lead to formation of shear solitons at stacking boundaries and strongly influence the electronic structure. We extend our analysis for twisted bilayer MoS_{2} to show that flatbands can occur at the valence band edge of twisted bilayer WS_{2}, MoSe_{2}, and WSe_{2} as well.
在二维材料的扭曲双层中,超平坦带有可能承载强关联,包括在能带的半填充处的莫特绝缘相。使用第一性原理密度泛函理论计算,我们在扭曲双层 MoS_{2}中发现了价带边缘处的超平坦带,MoS_{2}是典型的过渡金属二卤化物。计算得到的能带宽度分别为 5 和 23 MeV,对应于 56.5°和 3.5°的扭曲角度,与扭曲双层石墨烯在“魔法”角度附近的能带宽度相当。莫尔图案的大结构转变导致在堆积边界处形成剪切孤子,并强烈影响电子结构。我们将扭曲双层 MoS_{2}的分析扩展到表明,在扭曲双层 WS_{2}、MoSe_{2}和 WSe_{2}的价带边缘也可以出现平坦带。