Milbrat Alexander, Vijselaar Wouter, Guo Yuxi, Mei Bastian, Huskens Jurriaan, Mul Guido
PhotoCatalytic Synthesis and Molecular NanoFabrication, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.
ACS Sustain Chem Eng. 2019 Mar 4;7(5):5034-5044. doi: 10.1021/acssuschemeng.8b05756. Epub 2019 Feb 7.
H-BiVO :Mo was successfully deposited on microwire-structured silicon substrates, using indium tin oxide (ITO) as an interlayer and BiOI prepared by electrodeposition as precursor. Electrodeposition of BiOI, induced by the electrochemical reduction of -benzoquinone, appeared to proceed through three stages, being nucleation of particles at the base and bottom of the microwire arrays, followed by rapid (homogeneous) growth, and termination by increasing interfacial resistances. Variations in charge density and morphology as a function of spacing of the microwires are explained by (a) variations in mass transfer limitations, most likely associated with the electrochemical reduction of -benzoquinone, and (b) inhomogeneity in ITO deposition. Unexpectedly, H-BiVO :Mo on microwire substrates (4 μm radius, 4 to 20 μm spacing, and 5 to 16 μm length) underperformed compared to H-BiVO :Mo on flat surfaces in photocatalytic tests employing sulfite (SO ) oxidation in a KPi buffer solution at pH 7.0. While we cannot exclude optical effects, or differences in material properties on the nanoscale, we predominantly attribute this to detrimental diffusion limitations of the redox species within the internal volume of the microwire arrays, in agreement with existing literature and the observations regarding the electrodeposition of BiOI. Our results may assist in developing high-efficiency PEC devices.
以氧化铟锡(ITO)作为中间层,电沉积制备的BiOI作为前驱体,成功地将H-BiVO₄:Mo沉积在微线结构的硅衬底上。由对苯醌的电化学还原诱导的BiOI电沉积似乎经历三个阶段,即首先在微线阵列的底部和成核,然后是快速(均匀)生长,最后由于界面电阻增加而终止。微线间距函数的电荷密度和形态变化可以通过以下方式解释:(a)传质限制的变化,很可能与对苯醌的电化学还原有关;(b)ITO沉积的不均匀性。出乎意料的是,在pH 7.0的KPi缓冲溶液中使用亚硫酸盐(SO₃²⁻)氧化的光催化测试中,微线衬底(半径4μm,间距4至20μm,长度5至16μm)上的H-BiVO₄:Mo的性能不如平面上的H-BiVO₄:Mo。虽然我们不能排除光学效应或纳米尺度上材料特性的差异,但我们主要将此归因于微线阵列内部体积中氧化还原物种的有害扩散限制,这与现有文献以及关于BiOI电沉积的观察结果一致。我们的结果可能有助于开发高效的光电化学(PEC)器件。