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利用具有高探测率的全硅等离子体热电子探测器实现红外探测。

Achieving Infrared Detection by All-Si Plasmonic Hot-Electron Detectors with High Detectivity.

作者信息

Feng Bo, Zhu Jingyuan, Lu Bingrui, Liu Feifei, Zhou Lei, Chen Yifang

机构信息

Nanolithography and Application Research Group, State Key Lab of Asic and System, School of Information Science and Technology , Fudan University , Shanghai 200433 , China.

Department of Physics , Fudan University , Shanghai 200433 , China.

出版信息

ACS Nano. 2019 Jul 23;13(7):8433-8441. doi: 10.1021/acsnano.9b04236. Epub 2019 Jul 8.

Abstract

An improved architecture for all-Si based photoelectronic detectors has been developed, consisting of a specially designed metasurface as the antenna integrated into a Si nanowire array on the insulator by an electron beam lithography based self-alignment process. Simulation using the Finite Difference Time Domain (FDTD) method was carried out to ensure perfect absorption of light by the detector. Optic measurement shows a 90% absorption at 1.05 μm. Photoelectronic characterization demonstrates the responsivity and detectivity as high as 94.5 mA/W and 4.38 × 10 cm Hz/W, respectively, at 1.15 μm with the bandwidth of 480 nm, which is comparable to that of III-V/II-VI compound detectors. It is understood that the outstanding performances over other reported all-Si based detectors originate from the enhanced quantum efficiency in one-dimensional conduction channels with high density of states, which efficiently accommodate the emitted plasmonic hot electrons for high conduction in the Si nanowires, enabling the near-infrared detection by all-Si based detectors.

摘要

一种改进的全硅基光电子探测器架构已被开发出来,它由一个经过特殊设计的超表面作为天线组成,该天线通过基于电子束光刻的自对准工艺集成到绝缘体上的硅纳米线阵列中。使用时域有限差分(FDTD)方法进行了模拟,以确保探测器能完美吸收光。光学测量表明在1.05μm处吸收率为90%。光电子特性表明,在1.15μm、带宽为480nm时,响应度和探测率分别高达94.5 mA/W和4.38×10 cm Hz/W,这与III-V/II-VI化合物探测器相当。据了解,与其他已报道的全硅基探测器相比,其出色的性能源于一维高态密度传导通道中量子效率的提高,该通道能有效地容纳发射的等离子体热电子,以便在硅纳米线中进行高传导,从而实现全硅基探测器的近红外探测。

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