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基于透射电子显微镜(TEM)的颗粒(纳米)材料尺寸测量方法的评估

Evaluation of a TEM based Approach for Size Measurement of Particulate (Nano)materials.

作者信息

Verleysen Eveline, Wagner Thorsten, Lipinski Hans-Gerd, Kägi Ralf, Koeber Robert, Boix-Sanfeliu Ana, De Temmerman Pieter-Jan, Mast Jan

机构信息

Trace elements and nanomaterials, Sciensano, Groeselenbergstraat 99, 1180 Uccle, Belgium.

Biomedical Imaging Group, University of Applied Sciences and Arts Dortmund, Emil-Figge-Straβe 42, 44227 Dortmund, Germany.

出版信息

Materials (Basel). 2019 Jul 15;12(14):2274. doi: 10.3390/ma12142274.

Abstract

An approach for the size measurement of particulate (nano)materials by transmission electron microscopy was evaluated. The approach combines standard operating procedures for specimen preparation, imaging, and image analysis, and it was evaluated on a series of certified reference materials and representative test materials with varying physical properties, including particle size, shape, and agglomeration state. The measurement of the median value of the minimal external particle diameter distribution was intra-laboratory validated. The validation study included an assessment of the limit of detection, working range, selectivity, precision, trueness, robustness, and ruggedness. An uncertainty that was associated to intermediate precision in the range of 1-7% and an expanded measurement uncertainty in the range of 7-20% were obtained, depending on the material and image analysis mode. No bias was observed when assessing the trueness of the approach on the certified reference materials ERM-FD100 and ERM-FD304. The image analysis method was validated in an inter-laboratory study by 19 laboratories, which resulted in a within-laboratory precision in the range of 2-8% and a between-laboratory precision of between 2% and 14%. The automation and standardization of the proposed approach significantly improves labour and cost efficiency for the accurate and precise size measurement of the particulate materials. The approach is shown to be implementable in many other electron microscopy laboratories.

摘要

对一种通过透射电子显微镜测量颗粒(纳米)材料尺寸的方法进行了评估。该方法结合了样品制备、成像和图像分析的标准操作程序,并在一系列具有不同物理性质(包括粒径、形状和团聚状态)的认证参考材料和代表性测试材料上进行了评估。对最小外部颗粒直径分布的中值测量进行了实验室内部验证。验证研究包括对检测限、工作范围、选择性、精密度、准确性、稳健性和耐用性的评估。根据材料和图像分析模式,获得了与中间精密度相关的不确定度在1 - 7%范围内,扩展测量不确定度在7 - 20%范围内。在评估该方法对认证参考材料ERM - FD100和ERM - FD304的准确性时未观察到偏差。图像分析方法在一项由19个实验室参与的实验室间研究中得到验证,结果显示实验室内部精密度在2 - 8%范围内,实验室间精密度在2%至14%之间。所提出方法的自动化和标准化显著提高了颗粒材料准确精确尺寸测量的劳动效率和成本效率。该方法在许多其他电子显微镜实验室中都可实施。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/047b/6679035/4383047efb71/materials-12-02274-g001.jpg

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