Bianconi Simone, Mohseni Hooman
Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL 60208, United States of America.
Rep Prog Phys. 2020 Apr;83(4):044101. doi: 10.1088/1361-6633/ab72e5. Epub 2020 Feb 4.
Infrared detection and imaging are key enabling technologies for a vast number of applications, ranging from communication, to medicine and astronomy, and have recently attracted interest for their potential application in optical interconnects and quantum computing. Nonetheless, infrared detection still constitutes the performance bottleneck for several of these applications, due to a number of unsolved challenges, such as limited quantum efficiency, yield and scalability of the devices, as well as limited sensitivity and low operating temperatures. The current commercially dominating technologies are based on planar semiconducting PIN or avalanche detectors. However, recent developments in semiconductor technology and nano-scale materials have enabled significant technological advancement, demonstrating the potential for groundbreaking achievements in the field. We review the recent progress in the most prominent novel detection technologies, and evaluate their advantages, limitations, and prospects. We further offer a perspective on the main fundamental limits on the detectors sensitivity, and we discuss the technological challenges that need to be addressed for significative advancement of the field. Finally, we present a set of potential system-wide strategies, including nanoscale and low-dimensional detectors, light coupling enhancement strategies, advanced read-out circuitry, neuromorphic and curved image sensors, aimed at improving the overall imagers performance.
红外探测与成像是众多应用中的关键使能技术,涵盖从通信到医学和天文学等领域,并且最近因其在光互连和量子计算中的潜在应用而备受关注。尽管如此,由于一些尚未解决的挑战,如器件的量子效率有限、良率和可扩展性受限,以及灵敏度有限和工作温度低等问题,红外探测仍是其中一些应用的性能瓶颈。当前商业上占主导地位的技术基于平面半导体PIN或雪崩探测器。然而,半导体技术和纳米尺度材料的最新进展实现了重大的技术进步,展现了该领域取得突破性成果的潜力。我们回顾了最突出的新型探测技术的最新进展,并评估了它们的优点、局限性和前景。我们进一步探讨了探测器灵敏度的主要基本限制,并讨论了该领域取得重大进展所需解决的技术挑战。最后,我们提出了一系列潜在的全系统策略,包括纳米尺度和低维探测器、光耦合增强策略、先进的读出电路、神经形态和曲面图像传感器,旨在提高整体成像器的性能。