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利用粉煤灰生产和表征硅纳米颗粒:将农业废弃物转化为资源。

Production and characterization of silica nanoparticles from fly ash: conversion of agro-waste into resource.

机构信息

Institute of Nano Electronic Engineering, Universiti Malaysia Perlis, Perlis, Malaysia.

School of Bioprocess Engineering, Universiti Malaysia Perlis, Perlis, Malaysia.

出版信息

Prep Biochem Biotechnol. 2021;51(1):86-95. doi: 10.1080/10826068.2020.1793174. Epub 2020 Jul 25.

Abstract

A chemical method to synthesize amorphous silica nanoparticles from the incinerated paddy straw has been introduced. The synthesis was conducted through the hydrolysis by alkaline-acidic treatments. As a result, silica particles produced with the sizes were ranging at 60-90 nm, determined by high-resolution microscopy. The crystallinity was confirmed by surface area electron diffraction. Apart from that, chemical and diffraction analyses for both rice straw ash and synthesized silica nanoparticles were conducted by X-ray diffraction and Fourier-transform infrared spectroscopy. The percentage of silica from the incinerated straw was calculated to be 28.3. The prominent surface chemical bonding on the generated silica nanoparticles was with Si-O-Si, stretch of Si-O and symmetric Si-O bonds at peaks of 1090, 471, and 780 cm, respectively. To confirm the impurities of the elements in the produced silica, were analyzed using X-ray photoelectron spectroscopy and energy dispersive X-ray spectroscopy. The stability of silica nanoparticles was investigated using thermogravimetric analysis and zeta potential. The measured size from zeta potential analysis was 411.3-493 nm and the stability of mass reduction was located at 200 °C with final amount of mass reduced ∼88% and an average polydispersity Index was 0.195-0.224.

摘要

已经介绍了一种从焚烧的稻秆中合成无定形二氧化硅纳米粒子的化学方法。该合成是通过碱性-酸性处理的水解进行的。结果,通过高分辨率显微镜确定,所生成的二氧化硅颗粒的尺寸在 60-90nm 之间。通过表面面积电子衍射证实了结晶度。除此之外,还通过 X 射线衍射和傅里叶变换红外光谱对稻秆灰和合成的二氧化硅纳米粒子进行了化学和衍射分析。从焚烧的稻草中计算出的二氧化硅百分比为 28.3。生成的二氧化硅纳米粒子上突出的表面化学键合为 Si-O-Si、Si-O 伸展和对称 Si-O 键,分别在 1090、471 和 780cm 的峰处。为了确认所生产的二氧化硅中元素的杂质,使用 X 射线光电子能谱和能量色散 X 射线光谱进行了分析。使用热重分析和 Zeta 电位研究了二氧化硅纳米粒子的稳定性。从 Zeta 电位分析测量的粒径为 411.3-493nm,质量减少的稳定性位于 200°C,最终质量减少约 88%,平均多分散指数为 0.195-0.224。

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