Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging.

Optical sensors combined with machine learning algorithms have led to significant advances in seed science. These advances have facilitated the development of robust approaches, providing decision-making support in the seed industry related to the marketing of seed lots. In this study, a novel approach for seed quality classification is presented. We developed classifier models using Fourier transform near-infrared (FT-NIR) spectroscopy and X-ray imaging techniques to predict seed germination and vigor. A forage grass () was used as a model species. FT-NIR spectroscopy data and radiographic images were obtained from individual seeds, and the models were created based on the following algorithms: linear discriminant analysis (LDA), partial least squares discriminant analysis (PLS-DA), random forest (RF), naive Bayes (NB), and support vector machine with radial basis (SVM-) kernel. In the germination prediction, the models individually reached an accuracy of 82% using FT-NIR data, and 90% using X-ray data. For seed vigor, the models achieved 61% and 68% accuracy using FT-NIR and X-ray data, respectively. Combining the FT-NIR and X-ray data, the performance of the classification model reached an accuracy of 85% to predict germination, and 62% for seed vigor. Overall, the models developed using both NIR spectra and X-ray imaging data in machine learning algorithms are efficient in quickly, non-destructively, and accurately identifying the capacity of seed to germinate. The use of X-ray data and the LDA algorithm showed great potential to be used as a viable alternative to assist in the quality classification of seeds.